Identification of defects at the interface between 3CSiC quantum dots and a SiO2 embedding matrix
نویسندگان
چکیده
Márton Vörös1, Adam Gali1,2, Efthimios Kaxiras3, Thomas Frauenheim4, and Jan M. Knaup*,3,4 1 Department of Atomic Physics, Budapest University of Technology Economics, 1111 Budapest, Hungary 2 Research Institute for Solid State Physics and Optics, Hungarian Academy of Sciences, P.O. Box 49, 1525 Budapest, Hungary 3 Department of Physics, Harvard University, 17 Oxford St., Cambride, MA, 02138, USA 4 Bremen Center for Computational Materials Science, University of Bremen, Am Fallturm 1, 28359 Bremen, Germany
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تاریخ انتشار 2012